Introduction
The Precision Analysis Laboratory is established with the purpose of integrating valuable instrument and equipment services from relevant institutions within the school and assisting in cultivating talents with special expertise related to instruments. It also provides sample submission and analysis services to public and private colleges and universities, public research institutions and industrial R&D units, and All instruments and equipment in the center are equipped with operators to serve clients.
| Item | Instrument | Function description | Picture |
| 1 | Multifunctional X-ray Diffractometer XRD (D8 ADVANCE) |
The D8 ADVANCE is ideal for all X-ray powder diffraction and scattering applications, such as classic X-ray powder diffraction (XRD), pair distribution function (PDF) analysis, small angle X-ray scattering (SAXS) and wide angle X-ray scattering (WAXS). Due to its excellent adaptability, it can measure all types of samples: from liquids to powders, from thin films to solid blocks. |  |
| 2 | Field Emission Scanning Electron Microscope FE-SEM (HITACHI SU3900) |
1.High resolution for improved top-surface imaging 2.Automation and support functions that improve usability 3.Realize STEM imaging solely by UVD-STEM sample holder 4.Schottky SEM with large specimen chamber to expand application capabilities (1)5 axis computer eucentric motorization stage (2)SEM MAP (3)5nm guaranteed (accelerating voltage: 1kV) (4)Magnification Range: 5x～800,000x (photo size) |
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| 3 | Transmission Electron Microscope TEM |
Use high-energy electron beams to penetrate the test piece and detect the light and dark images formed by the scattered electrons to observe the internal microstructure and crystal structure of the test piece. By capturing the characteristic X-rays emitted by the test piece, the chemical composition of the micro-region of the test piece is analyzed. |  |
| 4 | Field Emission Scanning Electron Microscope FE-SEM |
Use secondary electrons and backscattered electron images to observe the surface morphology of the test piece. The application fields include semiconductor, metallurgy, machinery, minerals, biology, medicine, chemistry, physics, etc. By capturing the characteristic X-rays emitted by the test piece, the chemical composition of the micro-region of the test piece is analyzed. |  |
| 5 | Scanning Electron Microscope SEM |
Use secondary electrons and backscattered electron images to observe the surface morphology of the test piece. The application fields include semiconductor, metallurgy, machinery, minerals, biology, medicine, chemistry, physics, etc. By capturing the characteristic X-rays emitted by the test piece, the chemical composition of the micro-region of the test piece is analyzed. |  |
| 6 | X-ray Diffractometer XRD |
Use X-ray to carry out unit cell identification, qualitative analysis of composition phases and atomic structure analysis. |  |
